Jonathan McMenamin, Marketing Communications Coordinator, EDAX
EDAX is considered one of the leaders in the world of microscopy and microanalysis. After concentrating on advancements to our Energy Dispersive Spectroscopy (EDS) systems for the Scanning Electron Microscope (SEM) over the past few years, EDAX turned its attention to advances in Electron Backscatter Diffraction (EBSD) and EDS for the Transmission Electron Microscope (TEM) in 2019.
After the introduction of the Velocity™ Plus EBSD camera in June 2018, which produces indexing speeds greater that 3,000 indexed points per second, EDAX raised the bar further in 2019. In March, the company announced the arrival of the fastest EBSD camera in the world, the Velocity™ Super, which can go 50% faster at 4,500 indexed points per second. This was truly a great accomplishment!
EBSD orientation map from additively manufactured Inconel 718 collected at 4,500 indexed points per second at 25 nA beam current.
Less than three months later, EDAX added a new detector to its TEM product portfolio. The Elite T Ultra is a 160 mm2 detector that offers a unique geometry and powerful quantification routines for comprehensive analysis solutions for all TEM applications. The windowless detector’s geometric design gives it the best possible solid angle to increase the X-ray count rates for optimal results.
EDAX Elite T Ultra EDS System for the TEM.
Just before the annual Microscopy & Microanalysis conference, EDAX launched the OIM Matrix™ software module for OIM Analysis™. This new tool gives users the ability to perform dynamic diffraction-based EBSD pattern simulations and dictionary indexing. Users can now simulate EBSD patterns based on the physics of dynamical diffraction of electrons. These simulated patterns can then be compared to experimentally collected EBSD patterns. Dictionary indexing helps improve indexing success rates over standard Hough-based indexing approaches. You can watch Dr. Stuart Wright’s <a href=”https://youtu.be/Jri181evpiA” target=”_blank”>presentation from M&M</a> for more information.
Dictionary indexing flow chart and conventional indexing results compared with dictionary indexing results for a nickel sample with patterns collected in a high-gain/noisy condition.
EDAX has several exciting product announcements on the way in early 2020. We have teased a two of these releases, APEX™ Software for EBSD and the Clarity™ Direct Electron Detector. APEX™ EBSD will give users the ability to characterize both compositional and structural characteristics of their samples on the APEX™ Platform. It gives them the ability to collect and index EBSD patterns and EBSD maps, as well as allow for simultaneous EDS-EBSD collection. You can learn more about APEX™ EBSD in the September issue of the Insight newsletter and in our “APEX™ EBSD – Making EBSD Data Collection How You Want It” webinar.
EBSD of a Gibeon Meteorite sample covering a 7.5 mm x 6.5 mm area using ComboScan for large area analysis.
The Clarity™ is the world’s first commercial direct electron detector (DeD) for EBSD. It provides patterns of the highest quality and sensitivity with no detector read noise and no distortion for optimal performance. The Clarity™ does not require a phosphor screen or light transfer system. The DeD camera is so sensitive that individual electrons can be detected, giving users unprecedented performance for EBSD pattern collection. It is ideal for analysis of beam sensitive samples and potential strain applications. We recently had a webinar “Direct Electron Detection with Clarity™ – Viewing EBSD Patterns in a New Light” previewing the Clarity™. You can also get a better understanding of the system in the December issue of the Insight newsletter or the .
EBSD pattern from Silicon
using the Clarity™ detector.
All this happened in one year! 2020 looks to be another great year for EDAX with further improvements and product releases to offer the best possible tools for you to solve your materials characterization problems.