What’s in a Name?

Matt Nowell, EBSD Product Manager, EDAX

The Globe Theatre

I recently had the opportunity to attend the RMS EBSD meeting, which was held at the National Physics Lab outside of London. It was a very enjoyable meeting, with lotsof nice EBSD developments. While I was there, I was able to take in a bit of London as well. One of the places I visited was the Shakespeare’s Globe Theater. While I didn’t get a chance to see a show here (I saw School of Rock instead), it did get me thinking about one of the Bard’s more famous lines, “What’s in a name? That which we call a rose by any other word would smell as sweet” from Romeo and Juliet.

I bring this up because as EBSD Product Manager for EDAX, one of my responsibilities is to help name new products. Now my academic background is in Materials Science and Engineering, so understanding how to best name a product has been an interesting adventure.


The earliest product we had was the OIM™ system, which stood for Orientation Imaging Microscopy. The name came from a paper introducing EBSD mapping as a technique. At the time, we were TSL, which stood for TexSem Laboratories, which was short for Texture in an SEM. Obviously, we were into acronyms. We used a SIT (Silicon Intensified Target) camera to capture the EBSD patterns. We did the background processing with a DSP-2000 (Digital Signal Processor). We controlled the SEM beam with an MSC box (Microscope System Control).

Our first ‘mapped’ car.

For our next generator of products, we branched out a bit. Our first digital Charge-Coupled Device (CCD) camera was called the DigiView, as it was our first digital camera for capturing EBSD patterns instead of analog signals. Our first high-speed CCD camera was called Hikari. This one may not be as obvious, but it was named after the high-speed train in Japan, as Suzuki-san (our Japanese colleague) played a significant role in the development of this camera. Occasionally, we could find the best of both worlds. Our phase ID product was called Delphi. In Greek mythology, Delphi was the oracle who was consulted for important decisions (could you describe phase ID any better than that?). It also stood for Diffracted Electrons for Phase Identification.

Among our more recent products, PRIAS™ stands for Pattern Region of Interest Analysis System. Additionally, though, it is meant to invoke the hybrid use of the detector as both an EBSD detector and an imaging system. TEAM™ stands for Texture and Elemental Analysis System, which allowed us to bridge together EDS and EBSD analysis in the same product. NPAR™ stands for Neighbor Pattern Averaging and Reindexing, but I like this one as it sounds like I named it because of my golf game.
I believe these names have followed in the tradition of things like lasers (light amplification by stimulated emission of radiation), scuba (self-contained underwater breathing apparatus), and CAPTCHA (Completely Automated Public Turing test to tell Computers and Humans Apart). It generates a feeling of being part of the club, knowing what these names mean.

Velocity™ EBSD Camera

The feedback I get though, is that our product names should tell us what the product does. I don’t buy into this 100%, as my Honda Pilot isn’t a self-driving car, but it is the first recommendation on how to name a product ( Following this logic, our latest and world’s fastest EBSD camera is the Velocity™. It sounds fast, and it is.

Of course, even when using this strategy, there can be some confusion. Is it tEBSD (Transmission EBSD) or TKD (Transmission Kikuchi Diffraction)? Does HR-EBSD give us better spatial resolution? Hopefully as we continue to name new products, we can make our answer clear.

A Lot of Excitement in the Air!

Sia Afshari, Global Marketing Manager, EDAX

After all these years I still get excited about new technologies and their resulting products, especially when I have had the good fortune to play a part in their development. As I look forward to 2019, there are new and exciting products on the horizon from EDAX, where the engineering teams have been hard at work innovating and enhancing capabilities across all product lines. We are on the verge of having one of our most productive years for product introduction with new technologies expanding our portfolio in electron microscopy and micro-XRF applications.

Our APEX™ software platform will have a new release early this year with substantial feature enhancements for EDS, to be followed by EBSD capabilities later in 2019. APEX™ will also expand its wings to uXRF providing a new GUI and advanced quant functions for bulk and multi-layer analysis.

Our OIM Analysis™ EBSD software will also see a major update with the addition of a new Dictionary Indexing option.

A new addition to our TEM line will be a 160 mm² detector in a 17.5 mm diameter module that provides an exceptional solid angle for the most demanding applications in this field.

Elite T EDS System

Velocity™, EDAX’s low noise CMOS EBSD camera, provides astonishing EBSD performance at greater than 3000 fps with high indexing on a range of materials including deformed samples.

Velocity™ EBSD Camera

Last but not least, being an old x-ray guy, I can’t help being so impressed with the amazing EBSD patterns we are collecting from a ground-breaking direct electron detection (DED) camera with such “Clarity™” and detail, promising a new frontier for EBSD applications!
It will be an exciting year at EDAX and with that, I would like to wish you all a great, prosperous year!

Happy Holidays from All of Us at EDAX!

Thank you to all the followers of our blog – we hope that you have been entertained, informed and amused by our posts this year. We will be taking a break until the second week of January 2019, but if you need any extra diversion over the holidays, don’t forget to take a look at the resources we have shared with you during the year and catch up on anything you may have missed.  We wish you a happy and healthy New Year and look forward to talking to you again in 2019.

All our on-demand webinars can be found here.  You can also find us on the following platforms:

Down Memory Lane

Sia Afshari, Global Marketing Manager, EDAX

For years I have been attending the Denver X-ray conference (DXC) and it is hard when it coincides with the Microscopy and Microanalysis Conference (M&M) as it has a few times in the past several years. It is just difficult for me to accept that the overlap is not avoidable!

My interests are twofold, marketing activities where my main responsibility lie, and technical sessions which still pique my curiosity and which are beneficial for future product development. In the past couple of years at M&M, it has been great to attend sessions devoted to the 50 year anniversaries of electron microscopy, technical evolution, and algorithms, where my colleagues have either been the subject of presentations or have given papers. I have had the fortune to meet and, in some cases, to reacquaint with some of the main contributors to the scientific advancement of electron microscopy.

Being at M&M, I have missed the final years of attendance at DXC of the “old-timers” who have retired. These are gentlemen, in the true meaning of the word, whom I have had the honor of knowing for over 30 years and who have been more than generous with their time with me. I recognize most of all their devotion and contribution in advancing x-ray analysis to where it is today. Their absence will be felt especially in the development of methodology and algorithm. As a friend, who was frustrated with the lack of availability of scientists with a deep knowledge in the field, recently put it, “these guys don’t grow on trees.”

Back at M&M this year, I listened to Frank Eggert talking about the “The P/B Method. About 50 Years a Hidden Champion”, and he brought back many memories. I recognized most of his referenced names, and the fact that they are no longer active in the industry! Looked around the room, I saw more people of the same hair color as mine (what is left). I thought about the XRF/XRD guys I used to know and who are also no longer around the industry. The old Pete Seeger song popped up in my mind with a new verse as; “where have all the algorithmic guys gone?”

When the Dust of M&M Settles, It’s Time to Take Stock….

Shawn Wallace, Applications Engineer, EDAX 

Shawn presents our 2nd Lunch & Learn session at M&M 2018.

For an applications engineer, M&M is our biggest and most stressful event. Back to back demos while making sure everything is perfect to truly show off the best you can offer, with presentations and poster thrown in for good measure. There is no real time to reflect during the show, so as the dust settles, I always like to reflect on the year past and the one coming (in our world it seems as though the year really begins and ends in August).

Over the past year, the EDAX EBSD world has seen major changes with the release of the Velocity™ detector. It was well received by our customers, which puts a smile on my face. Over the next year, you guys will have the system to play with and will really learn the power of it, showing that our hard work and time spent has really paid off. There is so much more in the works on the EBSD side that I wish I could tell you about. Stay tuned for that ride. It should be fun and exciting.

Velocity™ EBSD Camera

As for the EDS world, the release of the Elite T was a great group effort with many small changes behind the scenes making big differences to the product, with more to come.
That said, APEX™ still seems to steal the spotlight (sorry Matt!). With features being added quickly to each internal build, we see our customers’ needs being fulfilled one line of code at a time and in time, you will see them too.

EDAX webinar series.

While hardware and software are key, I think that it is just as important to reflect on all the interactions we have at the show with all our customers, partners and friends. It helps me understand what we did right (and wrong) on our journey in the last year. Between workshops, onsite training sessions, and shows, I see customers both at their work sites, seeing what they are working with, and out at a neutral site learning from their colleagues about what’s new in tech or new ways to answer interesting questions. This helps us all to understand your needs and wants, and where we as a community are going and growing.

With that in mind, I am turning this blog back over to you. Where do you see microanalytical technology going in the next year? What application areas do you see expanding? What is the best way for us to disseminate information to you, our users? (webinars, videos, blogs, workshops?) We invite you to Leave a Reply via the link below.

How to Increase Your Materials Characterization Knowledge with EDAX

Sue Arnell, Marketing Communications Manager, EDAX

The EDAX Applications and Product Management teams have been very busy offering free ‘continuing education’ workshops in September and October – with a great global response from our partners and customers.

At the end of September, Applications Specialist Shawn Wallace and Electron Backscatter Diffraction (EBSD) Product Manager Matt Nowell joined 6 additional speakers at a ‘Short Lecture Workshop for EBSD’, sponsored by EDAX at the Center for Electron Microscopy and Analysis (CEMAS) at The Ohio State University. The participants attended sessions ranging from ‘EBSD Introduction and Optimization of Collection Parameters for Advanced Application’ to ‘The Dictionary Approach to EBSD: Advances in Highly-Deformed and Fine-Grained Materials’.

Feedback on this workshop included the following comments, “This was a great learning opportunity after working with my lab’s EDAX systems for a couple of months”; “I like the diversity in the public and the talks.  I was very pleased with the overall structure and outcome”; and “Great! Very helpful.”

Matt Nowell presents at the ‘Short Lecture Workshop for EBSD’ at CEMAS, OSU.

In mid-October, EBSD Applications Specialist, Dr. Rene de Kloe traveled to India for a series of workshops on EBSD at the Indian Institute of Science (Bangalore), the International Advanced Research Center (Hyderabad), and the Indian Institute of Technology (Mumbai). Topics discussed at the sessions included:

• Effects of measurement and processing parameters on EBSD
• The application of EBSD to routine material characterization
• Defining resolution in EBSD analysis
• Three Dimensional EBSD analysis – temporal and spatial
• Advanced data averaging tools for improved EDS and EBSD mapping – NPAR™
• Microstructural Imaging using an Electron Backscatter Diffraction Detector – PRIAS™
• Transmission EBSD from low to high resolution

Dr. René de Kloe presents at one of three recent workshops in India.

According to our National Sales Manager in India, Arjun Dalvi, “We conducted this seminar at different sites and I would like to share that the response from all our attendees was very good. They were all eager to get the training from Dr. René and to take part in very interactive Q and A sessions, in which many analysis issues were solved.”

Global Applications Manager Tara Nylese was at the Robert A. Pritzker Science Center in Chicago, IL last week to give a presentation on “Materials Characterization with Microscopy and Microanalysis” for the Illinois Institute of Technology. “In this lecture, we started with a basic introduction to electron microscopy, and then dived deeper into the fundamentals of X-ray microanalysis. We explored both the basics of X-ray excitation, and how to evaluate peaks in an X-ray spectrum. From there, we looked at applied examples such as composition variation in alloys, chemical mapping of components of pharmaceutical tablets, and some fascinating underlying elemental surprises in biological materials.”

Finally, today we have 50 participants at the Geological Museum in Cambridge, MA for a training workshop given by Dr. Jens Rafaelsen and sponsored by Harvard University on “Taking TEAM™ EDS Software to the Next Level” * Presentation topics include:

• Basic operation of the TEAM™ EDS Analysis package
• How to get the most out of TEAM™ EDS Analysis
• Advanced training
• Tips and Tricks using TEAM™ EDS Analysis

Dr. Jens Rafaelsen presents at the Harvard workshop.

Here at EDAX, we are keen to provide our customers, potential customers, and partners with opportunities to improve their knowledge and polish their skills using the techniques, which are central to the EDAX product portfolio.  Our EDS, EBSD, WDS and XRF experts enjoy helping with regular training sessions, webinars, and workshops. If you would like to be included, please check for upcoming webinarsworkshops, and training sessions at

*A video of these workshop sessions will be available from EDAX in the coming weeks.

Celebrating the 50th Birthday of Microanalysis

Sia Afshari, Global Marketing Manager, EDAX

The Microscopy & Microanalysis (M&M) Conference is celebrating 50 years of microanalysis at this year’s meeting in St. Louis next week. There is an entire session (A18.3) dedicated to the 50-year anniversary and the historical background of microanalysis from several different perspectives.

My colleague, Dr. Patrick Camus will be presenting the history of EDAX in his presentation, “More than 50 Years of Influence on Microanalysis” at this session and this is a must see for everyone who is at all interested in the historical development and advances in microanalysis!

Looking back at some of the images in the field of microscopy and seeing how far we have come from static spectrum collection to the standardless quantification of complex materials makes me wonder (in a good way!), about the future and especially about the technical possibilities in microanalysis.

Figure 1. Nuclear Diodes EDAX System Interfaced to Cambridge Stereoscan Scanning Electron Microscope – circa 1968

Pat will be describing the evolution of the company from Nuclear Diodes (1962) through EDAX International (1972) and purchase by Philips (1974) to acquisition by Ametek in 2001. Many accomplished microanalysts have been part of the EDAX team along the journey and have contributed enormously to the technical development of microanalysis. The advancements which have been made to date and those which will continue in the future would have not been possible without the dedication and hard work of all these pioneers in this field.

Figure 2. EDAX Element Silicon Drift Detector on a Scanning Electron Microscope – 2017.

At EDAX, which happens to be older than 50 years, I have been honored to meet some of the pioneers of microanalysis. I extend my gratitude to all those whose work has made it possible for us to enjoy the level of sophistication achieved today and we hope to continue their innovative tradition!

Please click here for more information on EDAX at M&M 2017.