Those People and Things

Dr. Sophie Yan, Applications Engineer, EDAX

Click here to read the post in Chinese.

The end of the year is my conference season. I have been to various conferences since October and I have seen many new faces. Recently, I realized that several young people I trained have stepped into the electron microscopy and microanalysis world. Their reasons seemed to be similar: want a life like Sophie’s. I felt deeply honored but also frightened. Did I give the young people a good example or fantasy?

A couple of us who used to study and/or work at Shanghai Institute of Ceramics have organized an annual meetup at the Chinese Electron Microscopy Society Conference. This year the number of participants reached 19, indicating more and more people have joined this field. As time passes, I have been able to recognize some of the big names in microscopy, and I am overwhelmed at how quickly young scientists have become those big names. Indeed, when more and more new faces have become major players in this field, it indicates the prosperity of this field. I am very fortunate to be a witness of this booming industry.

Once at SEMICON, a participant from Taiwan couldn’t believe my decision to step out after he/she realized that I was no longer in the semiconductor industry. At that time, I didn’t care about his/her words, but right now I figured out why he/she felt so sorry for me. It is very fortunate to love a job you choose. The semiconductor industry was a little down at the time I left, but it has been developing incredibly fast afterwards and I have found the job I love. It is so good to see that my breakup with semiconductor made both of us happy.

Mr. Yang from The University of Science and Technology Beijing (the author of the first Chinese EBSD book you’re supposed to read in China) used to tell me that “I felt you have been attending a lot of conferences and got much more resources than other people.” So I really got lucky.

My EBSD mentor, European applications specialist, René de Kloe, has traveled all around the world. He is very knowledgeable and humble but shows his expertise when questioned. He always promptly and fully replies to my emails and is always ready to help. Although we meet often, every time I am impressed by his expertise and like him more.

Dr. Sophie Yan and Dr. Stuart Wright

Dr. Sophie Yan and Dr. Stuart Wright

EDAX EBSD experts at a meeting in Draper, UT.

EDAX EBSD experts at a meeting in Draper, UT.

And Dr. Stuart Wright, he is a legend in the EBSD world. His name appears in textbooks and references to all kinds of EBSD papers. He took René and I to the west coast of the United States the first time I met him. René said that his toes finally touched the water of the Pacific Ocean again and for the first time in 3 years. He said that his feet high fived each other from the last time he dipped his feet in Tokyo Bay. In 2017, ICOTOM was held in the small city where Stuart lives. As a conference organizer, he took care of everything by himself. That was the most successful conference that considered both academic atmosphere and hospitality. (Well, I must attend the next ICOTOM in Osaka in September 2020).

With lots of luck, I have been to many places and gotten in touch with big names in this field. The cost is I travel more than 50%, on mainly domestic trips with more than 100,000 kilometers every year. I have seen everything there is to see in the Beijing and Shanghai airports. In contrast, the streets of every city look common to me. A kind of common that you can’t figure out their meanings at a glance.

Beijing Daxing International Airport

The new Beijing Daxing International Airport opened in September 2019.

But when people ask what exactly is EDAX’s direct electron detection? I can finally calm down and keep the conversation going, although I just know a little about it. René and Stuart patiently explained it to me when I knew nothing about it, and now it is my turn to spread the word. This is a brand-new field, and EDAX is the first player. What can we do with direct electron detection? Just wait and see. For a sneak preview, take a look at René’s recent webinar, “Direct Electron Detection with Clarity™ – Viewing EBSD Patterns in a New Light”.

Look Closer

Dr. René de Kloe, Applications Specialist, EDAX

All our senses are aimed at observation. We feel, see, hear, smell and taste things to experience the world around us. We are relying on our senses to make many of our day-to-day decisions and choices. And especially in the upcoming holiday season, shops and companies in the business of selling things cleverly use shiny advertisements, brochures, fragrances, and unbeatable product descriptions to entice us to select their wares. All the time hoping that we will succumb to our senses that focus on the superficial appearance of products before thinking things through.

We must be very careful not to let this very successful marketing strategy subconsciously guide us when analyzing materials as well. During our work as microscopists we are continuously selecting samples, cutting and preparing them to expose a feature of interest, and then choosing the analytical tool and actual analysis area. How sure can we be that we really get representative and objective information?

Dr. René de Kloe's PhD thesis

Dr. René de Kloe’s PhD thesis.

As a geologist, I was taught to take your distance from a rock outcrop and look it over before going into any detail, knowing that the context of your observations is crucial in your interpretation. Then I would go in close to look, feel, and yes sometimes actually taste the rock in order to try to identify what I was actually looking at and how the overall structure fit in the geological setting of the area.

Observing this distance is crucial for your understanding of structures, but in some cases, you cannot get out far enough to see the bigger picture and then you must make do with what you can see.

Perhaps an extreme example is what I did for my PhD research. I have studied the occurrence and distribution of nm-scale films of amorphous material along grain boundaries in experimentally deformed rocks that originate deep inside the Earth. In total I may have characterized a few cubic microns of material but based on that I tried to draw conclusions on the effects of these melt layers on the movements of entire continents!

In microanalysis, we are suffering from the same problem. Microscopy inherently means that you cannot look at the wider picture and when you are looking at extremely small-scale features, their size combined with a practical image resolution may limit the observable surface even further. And one of the most difficult questions you then must ask yourself before starting an analysis is, if the analysis area is representative. And that can be a really tricky question. How objective are we all when browsing the sample surface to find a spot to collect the data? Don’t we all tend to preferentially pick an area that looks promising? I am not so sure that that would always be the most representative region.

It is not that long ago that the acquisition limits in EDS and EBSD were caused by the detector technology. For EDS mapping, we were quite happy if you could collect your data with 50,000 input counts per second and a 50% dead time. This meant that when you were collecting a 512 x 400 pixel map where you wanted to have, say 1000 X-ray counts per pixel, it would take you a few hours. And after that time someone else would be hovering behind you, eager to use the microscope. This seriously limited the sample area that could be analyzed and as a researcher you needed to think carefully about your analysis strategy to get representative information.

Single field EDS map of FeSi sample with REE phases

Single field EDS map of FeSi sample with REE phases.

The area that can be analyzed has changed dramatically with the introduction of the latest EDS detector technology. These detectors are capable of processing more than two million input counts and get maximum throughputs of 850,000 counts per second. You can now get the same area analysis in a matter of minutes, which allows you to analyse more samples or simply more areas on your sample. Alternatively, you can choose to get a wider view and collect large area mosaic maps to minimise the risk of unintended preferential area selection and get more representative data.

120 field multi-field EDS map of an igneous rock showing merged ROI maps of Si (red), Fe (yellow), and O (green) on a backscatter SEM image. Total image resolution 6144 x 4000 points ~ 5.4 x 3.5 mm

120 multi-field EDS map of an igneous rock showing merged ROI maps of Si (red), Fe (yellow), and O (green) on a backscatter SEM image. Total image resolution 6144 x 4000 points ~ 5.4 x 3.5 mm.

A similar dramatic improvement has occurred in EBSD technology. When I started as EBSD application specialist at EDAX in 2001, my first EBSD demo system could collect at least two points per second when it was not raining and the moon was in the right quarter (or perhaps more realistically, if I was really lucky to have a good sample with strong patterns). The map below was one of my first maps that I collected when getting to know the system and I still use it today as an example to show different typical EBSD mapping features, such as grain boundaries, subgrain boundaries, twins, and slip planes. This map contains “only” 124,405 points but took an 8.5-hour overnight scan to collect.

EBSD IPF on IQ map of Ni alloy

EBSD IPF on IQ map of Ni alloy.


49 field EBSD comboscan IPF on PRIAS™ center map of an Fe alloy

49 multi-field EBSD comboscan IPF on PRIAS™ center map of an Fe alloy.

The same map today would take less than half a minute to collect with a Velocity™ EBSD detector. Or when you would like to take a little wider view you can combine beam and stage movements to collect a 2.5 million point scan of an entire sample in about 15 minutes.

These technological improvements allow you to be more efficient with your time and collect the same data much faster. But alternatively, it can effectively open our eyes and allow us to investigate much larger areas to see the bigger picture. Just be careful when you look at things from a bit further away, sometimes at the end of the day it may seem that these things start looking back at you!

Large area EDS map of FeSi sample with REE phases – look who’s watching!

Large area EDS map of FeSi sample with REE phases – look who’s watching!

Coming Up To Speed

Eric Rufe, U.S. Northeast Sales Manager, EDAX

“Dad, do you want to see someone cut an arrow in half with a sword?”

That is the sort of question I’ve come to expect from my 13-year old son. Lately, he and his friends watch a YouTube show where two intrepid scientists conduct all sorts of crazy experiments, record with a high-speed camera, and play the results back in slow motion. In this case, one guy shot an arrow at the other, who managed to cut it in half in mid-flight on his first attempt. In other videos, they burst water balloons and spin flaming steel wool to create cascades of sparks. All these experiments are recorded with a high-speed camera and played back in slow motion. It is really a lot of fun to watch. And, I noticed the camera they use is made by AMETEK!

I have been paying attention to AMETEK high-speed cameras lately, in a tangential way. Let me explain. I joined EDAX just over one year ago as Northeast Sales Manager. At EDAX, I handle the EDS, WDS, EBSD and µ-XRF products. Although I used some of these products as a student, that was a long time ago. During most of my career I worked with other types of microscopy techniques, and the EDAX technology has advanced dramatically during that time. For example, silicon drift detectors with thermoelectric cooling had replaced the SiLi detectors form my student days, which mean no more filling up a LN2 dewar (Figure 1). Joining EDAX meant that I had a lot to learn and I had to learn it quickly.

Very old stock photo of a scientist filling a LN2 dewar for the old SiLi detectors.

Figure 1. Very old stock photo of a scientist filling a LN2 dewar for the old SiLi detectors.

Fortunately, EDAX has a lot of resources to bring me up to speed. EDAX does a good job of presenting webinars on new techniques and recent developments. These are all archived on the EDAX website, along with videos of presentations recorded at different meetings and workshops. I counted 94 different presentations dating back to 2014 and quickly set to work watching and learning. EDAX also has a lot of literature available through the website: product brochures, data sheets, articles, presentations, and essential knowledge briefings. Somewhere over 120 pieces of literature.

One of the benefits of the Northeast territory is that the EDAX headquarters is in my territory, located in Mahwah, NJ. This proximity makes it easy for me to bring customers to Mahwah for demonstrations. As you enter the demonstration area in Mahwah, you are greeted by a group of signs showing all of the different companies within AMETEK’ s Materials Analysis Division (MAD) (Figure 2). EDAX is one of several companies in MAD, along with CAMECA, Amptek, SPECTRO, Forza Silicon and Vision Research. There is some cross-pollination among these different companies, and I like to tell the story that EDAX is part of a larger group of related technologies. So, I made it a point to also learn something about each of these different companies and set about examining their websites.

Canvas signs on the wall outside the demo labs in Mahwah, NJ showing some of the companies in the AMETEK Materials Analysis Division.

Figure 2. Canvas signs on the wall outside the demo labs in Mahwah, NJ showing some of the companies in the AMETEK Materials Analysis Division.

Now we come back to the high-speed cameras. One of the sister companies makes high-speed cameras for a variety of applications. They have many great slow motions videos on their web page, including ballistics tests, water droplets, flying insects, and an exploding strawberry (yes, an exploding strawberry).

Collaboration with this sister company resulted in the Velocity™ EBSD camera, with collection speeds up to 4,500 indexed points per second. This is the fastest EBSD camera available, and it has been fun to demonstrate the speed to customers. Large maps that may require an overnight run can now be completed in minutes. The first generation of the Velocity™ EBSD Systems was launched in June 2018 with speeds up to 3,000 fps. This release date was shortly before I joined EDAX. The faster Velocity֭™, the Velocity™ Super EBSD Systems, were launched in March 2019. Only 9 months later, the new Velocity™ has a 50% increase in speed (Figure 3).

EDAX Velocity™ Super EBSD Camera EBSD orientation map from an additively manufactured Inconel 718 collected at 4,500 indexed points per second at 25 nA beam current
Figure 3. EDAX Velocity™ Super EBSD Camera (left) and an EBSD orientation map from an additively manufactured Inconel 718 collected at 4,500 indexed points per second at 25 nA beam current (right).

There has been a rapid release of new and improved products since I joined, in addition to the developments in the Velocity™ camera. EDAX released a 160 mm2 EDS detector for TEM, the Elite T Ultra. APEX™ software development has continued, and now APEX™ is available on the Element, Octane Elect, and Octane Elite EDS Systems. We are on the verge of releasing APEX™ for EBSD as well. New EBSD software (OIM Matrix™) has been released, which includes dynamic pattern simulation and dictionary indexing. In November, we will host a webinar on EBSD using a Direct Electron Detector.

The challenge I have been facing over the past 12 months is that no matter how fast I read, and watch, and learn, it seems there is always something new. I am reminded of the Red Queen, in Through the Looking-Glass, explaining to Alice:

“Now, here, you see, it takes all the running you can do, to keep in the same place”.

Things That Change The Way We Use EDS

Dr. Shangshang Mu, Applications Engineer, EDAX

I got into the EDS world about 10 years ago, when I started my PhD study at Boston University. In my first project, I needed to quantify the elemental composition of my experimental samples. My advisor told me that ideally, we should use an electron microprobe and that the nearest one was at MIT, which is literally on the other side of the Charles River. But after we heard of the hourly fee and estimated the number of samples I would need to analyze, we started to plan an alternative. We found out that there was a field emission SEM equipped with an EDS detector in our own Photonics Center, just across the street and most importantly it was free of charge. At that time, I knew neither microprobe nor EDS and decided to give EDS a try first. Even if it did not work, I had nothing to lose except wasting some time. Graduate students have plenty of time to waste. So finally, I didn’t cross the beautiful Charles River but Commonwealth Avenue for the EDS.

As a result, I was introduced to the EDS world by the EDAX Apollo 40 SDD detector and EDAX was the only EDS manufacturer I knew as a beginner. It is such a good brand name standing for Energy Dispersive Analysis of X-rays so in the first couple of years I was under the impression that it was the term of this technique. For quantitative analysis, I used known standards that were close to my experimental samples in composition to standardize and got pretty good results fast and easy. In the subsequent projects, I collected a lot of EDS maps and the Apollo 40 never disappointed me. Since the EDS detector worked well for my PhD projects, I no longer considered other techniques. By the way, although I missed the opportunity to learn how to use the microprobe across the river due to the budget issue, my first full-time job in the states was to manage a much fancier microprobe acquired by a former user of the MIT’s microprobe. He received his PhD in geochemistry from MIT and I got most of my microprobe skills from him.

As an entry level EDAX user in graduate school, I had no way to imagine that I turned myself into an EDAX applications engineer and right now I am celebrating my one-year anniversary. After I joined EDAX, I got to know that the Apollo was the first generation SDD detector series of EDAX and our current EDS detectors have much better all-around performance. At the beginning of my second year with EDAX, I looked back into the EDS data I collected in graduate school and noticed that they were collected at a much slower amp time (the time the detector processes one X-ray count) compared to current ones and the EDS maps looked kind of noisy in comparison to my current perspective. Prompted by these findings, I wanted to initiate the discussion with how advancements in detector technology shaped the way we use EDS.

Apollo 40 SDD at Boston University
EDAX Octane Elite SDD in Draper, UT
Figure 1. The EDAX Apollo 40 SDD attached to the SEM I used at Boston University (left) and the EDAX Octane Elite SDD I am currently using (right).


I believe all EDS users have heard of this rule of thumb: keep the dead time between 20% and 40%, or something like this. At least I was taught to keep the percentage within this range and as far as I know a lot of EDS users are following this rule. This is a traditional perspective that came out in the past when detector amp times were much slower. The dead time is all about throughput and affected by the amp time. Historically, if the dead time is below 20%, it means the detector either doesn’t receive enough X-ray counts per second to ensure high data quality or the amp time is too fast to maintain an optimal detector resolution. On the other hand, if the dead time is over 40%, the Input Counts Per Second (ICPS) is too high to be handled optimally by the current amp time and may lead to excessive summed peaks. We can get the dead time back in the range by either decreasing the beam current to lower the count rate or choosing a faster amp time.

In the past, we usually did not consider the second option since it would sacrifice the detector resolution a lot for throughput. However, the current generation of EDAX EDS detectors is equipped with CMOS based pre-amplifiers that allow much faster amp times ranging from 0.12 μs to 7.68 μs, while keeping very good resolution and high throughput. For example, if I have the EDAX Octane Elite detector in my lab, I can run eight times faster by moving the amp time from the slowest 7.68 μs to the intermediate 0.96 μs, the resolution is only decreased by roughly 4 eV (from 124 eV to 128 eV). This intermediate amp time can handle at least 80% of the job, however under this condition it is hard to make the dead time go over 20% unless the detector is receiving over 100K ICPS. Even if I use the fastest amp time at 0.12 μs, the resolution is still below 150 eV, which is not a significant decrease in resolution if you know that the detector resolution for those equipped with traditional JFET pre-amplifiers is about 250 eV at this fastest amp time. Since resolution is no longer a limiting factor, feel free to open your aperture to increase the count rate and choose a faster amp time to lower the dead time. In return, you will get a higher throughput, which means more statistics and higher quality of data. Although we can go below 20% dead time to have a throughput improvement, it still makes sense to apply the 40% upper bound since the detector will not convert X-rays efficiently once the dead time is beyond this maximum percentage.

When do we want to hit hundreds of thousands of ICPS and take advantage of the fast amp time and high throughput brought by current EDS detectors? While I was using the Apollo 40 at Boston University to collect EDS maps, I stuck to 12.8 μs amp time believing the higher the detector resolution, the better the map quality. Now, I have realized that the major limitation to the quality of EDS maps is not the detector resolution but the limited statistics at the pixel level. Not to mention for our current detectors, the degradation in resolution when running fast is very little. The quality of peak deconvolution is primarily determined by the level of statistics, even when dealing with tricky peak overlaps.

I did a quick study on a piece of floor tile in my lab that contains both calcium phosphate and zirconium silicate, so P and Zr are in distinct phases. P K and Zr L peaks are heavily overlapped with only 29 eV of energy difference. I used the Octane Elite detector to do a quick five-minute net intensity map on this floor tile at 26 nA beam current and 0.96 μs amp time. This combination gave me 160K ICPS and 28% dead time. For the purpose of comparison, I used the slowest amp time at 7.68 μs to yield the highest detector resolution and recollected the maps for 6.5 minutes. To keep the dead time at 28% I had to lower the beam current to 3.2 nA to constrain the ICPS at 20K. Obviously, in the first run Zr and P were separated out nicely in the sharp images (Figure 2 left), as it built up eight times more statistics than the second run in roughly the same amount of time. In the second run at the highest detector resolution, the separation was not quite as good (Figure 2 right). As we can see, the images are kind of pixelated and the coral pixels are mixed within the green in the overlay, so the slightly better detector resolution did not help at all. If I were able to know this trick as a rookie, I would be able to get higher quality maps in the same amount of time or get the same quality of maps faster.

Net intensity maps of P/Zr overlay and P collected at 0.96 μs amp time (left) and 7.68 μs amp time (right) for roughly 5 minutes.
Figure 2. Net intensity maps of P/Zr overlay and P collected at 0.96 μs amp time (left) and 7.68 μs amp time (right) for roughly 5 minutes.

From my point of view, the advancements in detector technology, the experience we gain, or a combination of the two change the way we use EDS.

Texture on the Greens

Matt Nowell, EBSD Product Manager, EDAX

For better or worse, I am a golfer. The story of how I became a golfer helps explain my love for EBSD, and evolution as a material scientist. While I was at the University of Utah trying to decide on a major, I enjoyed fishing. Here in Utah, we have lovely access to many rivers, streams, and lakes with great fishing potential. When I started investigating Materials Science and Engineering as a degree, I thought it would be interesting to learn about the graphite used in fishing rods, and how the different processes used improved the performance of the rods. With this interest, I enrolled in the Materials Science department. Fortunately (for the fish I like to think), two things happened that changed my recreational and professional focus.

Tate Nowell catching a Utah trout

My son catching a nice Utah trout.

First, I enrolled in Organic Chemistry. Memorizing different molecules was not something that I excelled at. This dampened my enthusiasm for all things polymer-based, like composite fishing rods. Second, I was hired to work in the Electron Microscopy lab for the Materials Science department. This gave me lots of direct exposure to SEM, TEM, EDS, and even XRD instruments. It also helped to build a strong appreciation for sample preparation, but that’s the topic for another blog. All these things pushed me in the direction of materials characterization, and when I graduated, it led me to TSL, EDAX, and EBSD.

How does all this relate to golf? Soon after I started working, I played a round of golf with some friends. I had played a few casual rounds over the years, but nothing serious. Looking back, I consider myself lucky because the parking lot for the EM characterization facility was also the parking lot for the University golf course, and if I had been bitten by the golf bug at that point, things might have occurred differently. After this round, which I greatly enjoyed, I went to the local golf store thinking about different golf clubs. I found a set where the shafts of the club were manufactured by the same company that made my favorite fishing rod. This seemed like a sign to me, so I bought the clubs and jumped right into becoming a golfer.

It was great timing. EBSD scans were slow. To collect a 20,000-point scan, which was our typical target at the time, took 5-6 hours. It was easy to fit in 9 holes during some of these scans. Today, with our new Velocity™ cameras, it takes about 5 seconds to collect this data. Sometimes there is barely enough time to hit a practice putt down the hall in the lab. Many of us in the office enjoyed playing together. We even commissioned an annual tournament called the Burrito Open, where we combined golf with Mexican food. If you examine the picture of the 2008 tournament closely, you may notice it is an International event, with participants from Europe (Rene de Kloe) and Japan (Suzuki-san).

2008 Burrito Open

2008 Burrito Open

This tournament also allowed us to indulge and combine golf with work a little bit. The first trophy was constructed from an old port cover we no longer needed. The second trophy was of course a crystal trophy. As you might imagine, there was some discussion over what crystal structure would be most appropriate.

Burrito Open Trophies

Burrito Open Trophies

There is plenty of time to think during a round of golf, and one of the things I’ve thought about is how the club heads are produced. When thinking about this, we are considering either woods (or more accurately metal woods) or irons. Irons are typically either cast or forged. Forged clubs are generally positioned for the better players, but what caught my eye is that some manufacturers started marketing the idea of microstructure and the role of grains in the material. One brand even pushes what they call Grain Flow Forged.

Grain Flow Forged Iron

Grain flow forged iron

Of course, just like the fishing rods, the processing of the club affects the properties. The key link is that the processing changes the microstructure, and the microstructure defines the properties. With that in mind, it’s a fun experiment to compare the microstructure of cast clubs versus forged clubs. Stuart Wright and I first did this experiment about 20 years ago for a conference on Materials in Sports, but given the increases in capability, it would be fun to reevaluate.

I sectioned and prepared EBSD samples from both forged and cast irons. These were both made with an unknown steel alloy and prepared with my standard metallographic preparation approach. Enough coarse-grained polishing was used to remove plating from the club surface. The resulting Image Quality + Orientation Maps (IPF relative to the surface normal direction) are shown below. These were collected from the face of the golf club. I prepared cross-sections for further analysis. I was a little surprised by both microstructures. The cast iron had a dual-component microstructure, with both generally equiaxed grains and needle shaped grain constituents. It looks a lot like a dual phase Ferrite-Martensite microstructure, but with martensite being tricky to directly identify with EBSD relative to ferrite, I indexed both regions with a BCC Ferrite material file. The local misorientations were higher in the needle shaped regions, and there were also some austenitic grains present in these regions. The forged iron microstructure has a bimodal grain size distribution, with larger equiaxed grains decorated and intermixed with smaller equiaxed grains. A second scan was collected at higher magnification and with a finer step size to better resolve these fine grains.

IQ and IPF ND Orientation Map from cast golf club

IQ and IPF ND Orientation Map from cast golf club

IQ and IPF ND Orientation Map from forged golf club

IQ and IPF ND Orientation Map from forged golf club

Higher magnification IQ and IPF ND Orientation Map from forged golf club

Higher magnification IQ and IPF ND Orientation Map from forged golf club

As expected, the microstructures of the forged and cast clubs are different. As a Materials Scientist and EBSD guy, I tend to think forging is a more interesting materials processing option. In this case though, both casting and forging have produced interesting microstructures that could use further investigation. I once bought a set of forged clubs, and it was with this set I made my only hole-in-one. I’m pretty sure there is a direct correlation, and when I buy my next set, I’ll continue my experimentations.

Celebrating Nearly 60 Years of Materials Analysis Expertise with EDAX

Arjun Dalvi, Regional Sales Manager – Southeast Asia and India, EDAX

During a recent trip to Bangkok, Thailand I visited a customer and was very happy to see that two EDAX DX-95 units were installed at his location. The units are a piece of history because EDAX hasn’t sold liquid nitrogen cooled detectors or systems anywhere in the world in quite some time.

When I asked the customer when this system was installed, he said it was installed more than 30 years ago, at a time when I was still in elementary school! EDAX was one of the first companies to produce liquid nitrogen cooled detectors for microanalysis.

EDAX DX-95 EDAX SiLi Detector
EDAX DX-95 (left) and SiLi detector (right) used over 30 years ago.

Since its origin in 1962, EDAX has provided customers with reliable, accurate microanalysis systems. The company has benefitted from its stellar reputation, as well as its, name recognition. The name EDAX almost has a generic trademark, because many people throughout the world refer to their Energy Dispersive Spectroscopy (EDS) systems as “EDAX” systems.

EDAX, a big name in microanalysis and microscopy, has a vast history in research and development of new technology and product improvements. The company has been a part of the AMETEK corporation since 2011. Since joining the well-respected organization of AMETEK, EDAX has been able to pursue new developments in the fields of EDS, EBSD and WDS analysis. After AMETEK acquired a company that produced silicon nitride windows, EDAX gained a great advantage by having an inhouse supplier for its new SDD window. This was a big revolution for EDAX’s EDS products. Now, EDAX is the only manufacturer that has a unique silicon nitride window with vacuum encapsulation technology. EDAX has become one of the top manufacturers of EBSD systems, providing solutions to various applications in the fields of microstructure and formation and deformation of new materials. The new CMOS-based Velocity™ EBSD Camera is the fastest EBSD camera on the market for high-speed EBSD mapping. In India, we have many users that have EBSD systems and are doing research in the fields of steel and metals.

Today, EDAX has a complete range of products with all the latest developments and inhouse raw materials needed to help us maintain quality and add to our customers’ confidence in our products.

I feel EDAX will come up with new developments for years to come. Maybe 30 years or more down the road, we will see the Element, Octane Elect, Octane Elite or Orbis at one of our customers sites, much like the DX-95, which is still in use today.


Dr. Stuart Wright, Senior Scientist EBSD, EDAX

The city has recently started burying a pipe down the middle of one of the roads into my neighborhood. There were already a couple of troublesome intersections on this road. The construction has led to several accidents in the past couple of weeks at these intersections and I am sure there are more to come.

A question from a reviewer on a paper I am co-authoring got me thinking about the impact of intersections of bands in EBSD patterns on the Hough transform. The intersections are termed ‘zone axes’ or ‘poles’ and a pattern is typically composed of some strong ones where several high intensity bands intersect as well as weak ones where perhaps only two bands intersect.

To get an idea of the impact of the intersections on the Hough transform, I have created an idealized pattern. The intensity of the bands in the idealized pattern is derived from the peaks heights from the Hough transform applied to an experimental pattern. For a little fun, I have created a second pattern by blacking out the bands in the original idealized pattern, leaving behind only the intersections. I created a third pattern by blacking out the intersections and leaving behind only the bands. I have input these three patterns into the Hough transform. As I expected, you can see the strong sinusoidal curves from the pattern with only the intersections. However, you can also see peaks, where these sinusoidal curves intersect and these correspond (for the most part) to the bands in the pattern.

In the figure, the middle row of images are the raw Hough Transforms and the bottom row of images are the Hough Transforms after applying the butterfly mask. It is interesting to note how much the Hough peaks differ between the three patterns. It is clear that the intersections contribute positively to finding some of the weaker bands. This is a function not only of the band intensity but also the number of zone axes along the length of the band in the pattern.

Eventually the construction on my local road will be done and hopefully we will have fewer accidents. But clearly, intersections are more than just a necessary evil 😊